Beilstein J. Nanotechnol.2024,15, 230–241, doi:10.3762/bjnano.15.22
structures is proposed. This research explored the wear of AFM tips during tapping mode and examined the effects of scanning parameters on estimatedtipdiameter and surface roughness. The experiment results show that the non-destructive method for measuring tip morphology is highly repeatable. Additionally
scanning frequency and free amplitude, and a set point of approximately 0.2, resulting in clear, high-quality AFM images.
Keywords: atomic force microscopy; estimatedtipdiameter; scanning parameter; tip reconstruction; tip wear; Introduction
AFM is a commonly used multifunctional technology in
al. [19] used the estimatedtipdiameter (ETD) as an indicator to evaluate tip wear and concluded that low set points can significantly reduce tip wear. Also, the probe can reach a predetermined amplitude faster, making faster scanning speeds possible. Huang et al. [20] not only used the ETD as an
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Figure 1:
Principle of AFM tip morphology extraction from sharp structures.